Scanning probe microscopes
Our laboratories host three atomic force microscopes (AFM) each suitable for different experimental conditions as for example magnetic fields, low temperature and different atmospheres. The specifications and AFM modes of the instruments are given below, details on how atomic force microscopy works can be found here.
Scanning Probe Microscopes
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NT-MDT NTEGRA Prima -
Bruker Multimode -
Attocube - Low temperature AFM
NT-MDT NTEGRA Prima AFM:
- T = -10 – 160 °C
- Ambient, N2, or vacuum (10-2 mbar) atmosphere
- 50 / 350mT (vert./hor. magnetic field)
- Top and/or bottom scanning
- Scan range: < 250 x 250 µm2
- Sample size: < 5 x 5 x 2 cm3
- AFM, cAFM (> 20 fA), PFM, EFM, MFM, …
Bruker Multimode:
- Scan range: < 180 x 180 µm2
- Sample size: < 1.5 x 1.5 x 1.5 cm3
- AFM, MFM (vertical, lateral), PFM, EFM, …
Attocube - Low temperature AFM:
- T = 1.8 – 300 K (He exchange gas)
- 12T / 2T (vert./hor. magnetic field)
- Optical-fiber system (vert. cantilever signals only)
- Scan range: < 150 x 150 µm2
- Sample size: < 1.0 x 1.0 x 0.5 cm3
- AFM, cAFM (> 1 pA), PFM, EFM, MFM, …